Swarup Bhunia | Source | Director, Warren B. Nelms Institute for the Connected World at University of...

Swarup Bhunia received his B.E. (Hons.) from Jadavpur University, Kolkata, India, and his M.Tech. degree from the Indian Institute of Technology (IIT), Kharagpur. He received his Ph.D. from Purdue University, IN, USA, in 2005. Currently, Dr. Bhunia is a preeminence professor and Steven Yatauro Faculty Fellow in the Department of Electrical and Computer Engineering at the University of Florida, Gainesville, FL, USA. Earlier, Dr. Bhunia served as the T. and A. Schroeder associate professor of Electrical Engineering and Computer Science at Case Western Reserve University, Cleveland, OH, USA. He has over twenty years of research and development experience with over 250 publications in peer-reviewed journals and premier conferences and ten edited or authored books (two upcoming) in the area of VLSI design, CAD and test techniques.

His research interests include low power and robust design, hardware security and trust, adaptive nanocomputing, and novel test methodologies. He has worked in the semiconductor industry on RTL synthesis, verification, and low-power design for about three years. Dr. Bhunia received several awards, including the EEE-CS TCVLSI Distinguished Research Award (2018), IBM Faculty Award (2013), Semiconductor Research Corporation (SRC) Technical Excellence Award (2005) as a team member, and best paper award in IEEE BioMedical Circuits and Systems Conference (BioCAS 2016).

Dr. Bhunia has been serving as founding editor-in-chief of the Journal of Hardware and Systems Security (HaSS), an associate editor of IEEE Transactions on CAD (TCAD), IEEE Transactions on Multi-Scale Computing Systems (TMSCS), ACM Journal of Emerging Technologies (JETC), and Journal of Low Power Electronics (JOLPE). He has served as a guest editor of IEEE Design & Test of Computers (2010, 2013), IEEE Computer Magazine (2016), and IEEE Journal on Emerging and Selected Topics in Circuits and Systems (2014). Additionally, he has given tutorials on low-power and robust design and testing at premier conferences, including International Test Conferences (ITC 2009). He is a distinguished ACM speaker and a senior member of IEEE.